SE-VE spectroscopy ellipsometer Introduction: The SE-VE is a cost-effective, fast-measuring spectroscopic ellipsometer with a compact, integrated design that is easy to use and provides fast, one-button measurement of the thickness and optical constants of various optical films. Cost-effective optical ellipsometry solution, compact integrated design, sophisticated user experience, one-button rapid measurement and analysis, human-computer interaction design, easy to use, rich database and geometric model library to ensure powerful data analysis capabilities, widely used Rapid characterization of various single-layer to multi-layer film thicknesses and optical constants in scientific research/enterprise. Features: 1. Using high-performance imported composite light source, the spectral coverage can be seen in the near-infrared range (400-800nm) 2, high-precision rotary compensator modulation, PCRSA configuration, high-speed acquisition of Psi/Delta spectral data 3, hundreds of material databases, a variety of algorithm model library, covering most of the current photovoltaic materials Technical Parameters: 1, the degree of automation: fixed angle 2, application positioning: economical 3, basic functions: Psi/Delta, N/C/S, R and other spectra 4. Analytical spectrum: 400-800nm 5, single measurement time: 0.5-5s 6, repeatability measurement accuracy: 0.05nm 7, spot size: large spot 1-3mm 8, the angle of incidence adjustment: fixed angle 9. Angle of incidence: 65° 10, focus mode: manual focus 11, Mapping itinerary: not supported 12, support sample size: * up to 160mm
Introduction: The SE-VE is a cost-effective, fast-measuring spectroscopic ellipsometer with a compact, integrated design that is easy to use and provides fast, one-button measurement of the thickness and optical constants of various optical films. Cost-effective optical ellipsometry solution, compact integrated design, sophisticated user experience, one-button rapid measurement and analysis, human-computer interaction design, easy to use, rich database and geometric model library to ensure powerful data analysis capabilities, widely used Rapid characterization of various single-layer to multi-layer film thicknesses and optical constants in scientific research/enterprise.
