SE-PV photovoltaic ellipsometer Introduction: SE-PV Photovoltaic Ellipsometer is a special-purpose spectroscopic ellipsometer for the photovoltaic industry. It is designed for the custom measurement of surface anti-reflection film of suede monocrystalline or polycrystalline silicon solar cells in the photovoltaic industry, and quickly realizes the physical property characterization of thin films. Photovoltaic ellipsometer is widely used in the measurement of ellipsometry of photovoltaic suede single crystal silicon or polysilicon surface anti-reflection film, which realizes the rapid characterization of thin film, optical constant and geometric feature size of single-layer to multi-layer film. Features: 1, photovoltaic special spectrum ellipsometry measurement technology, material customization library, one-click fast call 2, the configuration of tiltable, large-angle sample table, adjust the optimal reflection of the surface of the suede single crystal silicon 3. Configure imported high-power, high-life light source to increase the amount of measurable reflection information after reducing the suede surface 4. Photovoltaic-specific scattering matrix algorithm describes the interaction between light and conical surface to ensure the validity of the data. Technical Parameters: 1, the degree of automation: support automation program customization 2, application positioning: photovoltaic special type 3, basic functions: Psi/Delta, N/C/S and other spectra 4, analytical spectrum: 380-1000nm, support on-demand customization 5, single measurement time: 0.5-5s 6, repeatability measurement accuracy: 0.01nm
Introduction: SE-PV Photovoltaic Ellipsometer is a special-purpose spectroscopic ellipsometer for the photovoltaic industry. It is designed for the custom measurement of surface anti-reflection film of suede monocrystalline or polycrystalline silicon solar cells in the photovoltaic industry, and quickly realizes the physical property characterization of thin films. Photovoltaic ellipsometer is widely used in the measurement of ellipsometry of photovoltaic suede single crystal silicon or polysilicon surface anti-reflection film, which realizes the rapid characterization of thin film, optical constant and geometric feature size of single-layer to multi-layer film.
