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NeuroSEM100 High Throughput Scanning Electron Microscope

Product ID：GDXsmdj008

Price: Please inquire PDF Format

Supply Ability:20 SETS/MON

Port:SHENZHEN

Product Introduction
Consulting

Model NumberNeuroSEM100

Brand NameBEIJINGJUSHUKEJI

Payment TermsT/T, paypal

NeuroSEM100 High Throughput Scanning Electron Microscope
Introduction
NeuroSEM-100 Field Emission Scanning Electron Microscope is a new generation of field emission scanning electron microscope system designed for biological tissue and cell ultrastructural observation, especially for ultra-high speed imaging of microscopic scale brain nerve connection map. The system combines high resolution and high imaging speed. It is the most intelligent and easy to operate scanning scanning electron microscope system in the world.
High Throughput SEM, the NavigatorTM series is a new application in the field of material surface analysis and neurobiology with high-throughput electron microscopy. Unlike traditional SEM, NavigatorTM is a newly designed high-throughput electro-optical imaging system for specific applications of large-area SEM analysis, focusing on optimizing the imaging rate of BSE at low-point energy while ensuring that the receiving efficiency of SE is over 95%. The imaging rate of SE and BSE is about 10 times that of traditional SEM. With the auxiliary tracking module and optical navigation and other auxiliary modules, the integrated imaging rate is more than 30 times that of traditional SEM. Taking semiconductor wafer analysis as an example, scanning a 300 um x 300 um wafer reticle in a 4 nm pixel size requires a conventional electron microscope to perform the same work for at least 38 minutes, while a high throughput requires only 0.9 minutes to complete automatic image acquisition and generate Google. Map-style panoramic sample map. All you have to do is push the mouse wheel, and everything is displayed on the screen and you can mark the location of interest. You can also use the manual mode to quickly flip through the samples in real time to eliminate unnecessary optical parameter adjustments. The industry's first indexed viewing feature allows users to focus on searching for information about the sample itself without the hassle of operating the electron microscope.
Application areas: large-area surface material analysis, semiconductor wafer analysis, neurobiology 3D reconstruction, biological tissue section analysis.
Features

The world's first high-efficiency electronic collection and imaging system, using coaxial electronic direct detection technology and high-speed FPGA acquisition module, enables the system to achieve 100M/s secondary electrons (Second Electro Electron) at low acceleration voltage (1kV) for the first time in the world. Ultra-high-speed simultaneous imaging of Backscatter Electron! The system features an extraordinary video-level (120fps@512X512) nanoscale analysis capability that transforms SEM from a traditional nanometer "camera" to a nano-camera.
The optical path of the electron optical tube designed for low acceleration voltage and resolution under large field of view is designed by immersing the oscillating electromagnetic compound lens, which can achieve 1.8nm at 1.8nm and 3kV at 1kV acceleration voltage. The resolution capability and the area with high-resolution field of view are more than 4 times larger than traditional SEM, and maintain high linearity (1 ‰ metering level).
The system's highly intelligent combination of ultra-high-speed imaging capabilities (4TB/day) enables cross-scale information fusion. It can be fully automated and large-area (100mmX100mm) holographic atlas imaging mode, which can automatically collect the missing information of the sample while maintaining high resolution, and draw it into Google map-style panoramic information browsing. Combined with the artificial intelligence (A.I.) algorithm, the overall nano-crystal distribution statistics, marking and classification of various defects, composition distribution and other electron micro-analysis can be performed on engineering-grade materials. And the standard vacuum pre-extraction chamber and telescopic arm mechanism, so that it has a true "one-button automatic sample change".
Complete secondary development interface, to maximize the satisfaction of customer customization requirements, improve the image acquisition efficiency of SEM, and play the high-throughput performance of SEM, Navigator high-throughput electron microscope for a complete secondary development interface for Customized personalized image acquisition process.
In addition to the biological field, the Navigator series has a wide range of applications in materials science and industrial applications. Thanks to its high-throughput design of hardware systems and arrayed scanning support for software systems, Navigator is particularly well-suited for large-area atlas image acquisition of samples, with a result similar to the number T of Google maps. Image data package.

Technical Parameters

NeuroSEM™ Essential Specifications
Resolution	1.5nm@1kV 1.2nm@3kV (SE) 1.0nm@10kV	3nm@1kV 2.5nm@3kV (BSE) 2.0nm@10kV
Accelerating Voltage	0.1kV-12kV
Magnification Zoom	50X – 600,000X
Emitter	Thermal field emission, Stability<1%/week
Pixel Size	0.5nm–60nm
Image Processing	512X512–8kX8k
Image Rotation	+/-90°
Beam Shift	+/-2μm at 20,000X
Stage Repeatability	+/-100nm with 200mm range (X/Y) +/-50nm with 200mm range (optional)
Image Channels	BSE Detector SE Detector Bright field STEM Detector (optional) Dark field STEM Detector (optional)
Image Rate	Up to 400M pixels/s

Introduction
NeuroSEM-100 Field Emission Scanning Electron Microscope is a new generation of field emission scanning electron microscope system designed for biological tissue and cell ultrastructural observation, especially for ultra-high speed imaging of microscopic scale brain nerve connection map. The system combines high resolution and high imaging speed. It is the most intelligent and easy to operate scanning scanning electron microscope system in the world.
High Throughput SEM, the NavigatorTM series is a new application in the field of material surface analysis and neurobiology with high-throughput electron microscopy. Unlike traditional SEM, NavigatorTM is a newly designed high-throughput electro-optical imaging system for specific applications of large-area SEM analysis, focusing on optimizing the imaging rate of BSE at low-point energy while ensuring that the receiving efficiency of SE is over 95%. The imaging rate of SE and BSE is about 10 times that of traditional SEM. With the auxiliary tracking module and optical navigation and other auxiliary modules, the integrated imaging rate is more than 30 times that of traditional SEM. Taking semiconductor wafer analysis as an example, scanning a 300 um x 300 um wafer reticle in a 4 nm pixel size requires a conventional electron microscope to perform the same work for at least 38 minutes, while a high throughput requires only 0.9 minutes to complete automatic image acquisition and generate Google. Map-style panoramic sample map. All you have to do is push the mouse wheel, and everything is displayed on the screen and you can mark the location of interest. You can also use the manual mode to quickly flip through the samples in real time to eliminate unnecessary optical parameter adjustments. The industry's first indexed viewing feature allows users to focus on searching for information about the sample itself without the hassle of operating the electron microscope.
Application areas: large-area surface material analysis, semiconductor wafer analysis, neurobiology 3D reconstruction, biological tissue section analysis.