KYKY-EM8000F field emission gun scanning electron microscope Introduction
Scanning electron microscopy (SEM) is a microscopic morphology observation method between transmission electron microscope and optical microscope. It can directly use the material properties of the sample surface material for microscopic imaging. Features
Schottky field emission electron gun, high brightness, good monochromaticity, small electron beam spot, long life
Maintains good brightness and high resolution at low accelerating voltages
High beam stability and small dispersion, suitable for long-term accurate analysis, such as BSE, EDS, EBSD
Low accelerating voltage non-conducting samples can be directly observed without the need to spray gold
Easy to operate, all EM operations can be done with just a mouse
Can be customized, electronic optical systems, sample stations, etc. Technical Parameters
Resolution: 1.5 nm (15KV); 5nm (3KV)
Magnification: 15x~500,000x
Acceleration voltage: 0 ~ 30KV
Electron gun: Schottky Schottky field emission electron gun
Auto adjustment function: focus, brightness/contrast, astigmatism, electron beam pair medium
Vacuum system: High vacuum secondary electron detector (with the function of protecting the detector probe from collision)
Itinerary:
X: 0 ~ 80mm
Y: 0 ~ 60mm
Z: 0 ~ 50mm
R: 360°
T: -5° ~ 90°
Detector: SE detector, BSE detector (optional), X-ray spectrometer (optional), EBSD (optional)
Scanning electron microscopy (SEM) is a microscopic morphology observation method between transmission electron microscope and optical microscope. It can directly use the material properties of the sample surface material for microscopic imaging.
