KYKY-EM6900 tungsten filament scanning electron microscope Introduction
Scanning electron microscopy (SEM) is a microscopic morphology observation method between transmission electron microscope and optical microscope. It can directly use the material properties of the sample surface material for microscopic imaging. Features
High resolution and better image quality
Folding fork structure tungsten wire cathode, easy to replace the filament
Pure Chinese operation interface with one-button imaging
Automatic adjustment function: electron gun heating, bias, centering, focusing, brightness, contrast, astigmatism, astigmatism, etc.
Automatic calibration, automatic fault detection
Low maintenance, maintenance costs Technical Parameters
Resolution: 3.0nm (30KV)
Magnification: 6x ~ 300,000x
Electron gun type: Twisted hair fork structure tungsten wire cathode
Acceleration voltage: 0 ~ 30KV
Lens system: three-stage electromagnetic lens (conical objective)
Objective lens diaphragm: Three diaphragms can be adjusted outside the vacuum
Sample stage: EM6900: Manual EM6900Z: X/Y automatic table
Itinerary
X: 0 ~ 80mm
Y: 0 ~ 60mm
Z: 0 ~ 50mm
R: 360°
T: -5° ~ 90°
Detector: SE detector, BSE detector (optional), X-ray spectrometer (optional), EBSD (optional)
Vacuum system: molecular pump
Introduction
Scanning electron microscopy (SEM) is a microscopic morphology observation method between transmission electron microscope and optical microscope. It can directly use the material properties of the sample surface material for microscopic imaging.
