KYKY-EM6200 tungsten filament scanning electron microscope Introduction
Scanning electron microscopy (SEM) is a microscopic morphology observation method between transmission electron microscope and optical microscope. It can directly use the material properties of the sample surface material for microscopic imaging. Features
Economical and practical
One-button imaging
Automatic adjustment function: electron gun heating, bias, centering, focusing, brightness, contrast, astigmatism, astigmatism, etc.
Automatic calibration, automatic fault detection
Low maintenance, maintenance costs Technical Parameters
Resolution: 4.5nm (30KV)
Magnification: 15x ~ 250,000x
Electron gun type: forked tungsten cathode
Acceleration voltage: 0 ~ 30KV
Lens system: three-level electromagnetic lens
Objective lens stop: Three diaphragms can be adjusted outside the vacuum (100, 100, 200)
Sample stage: EM6200: Manual EM6200Z: X/Y axis automatic
Itinerary
X: 0 ~ 50mm (large sample stage 0 ~ 80mm)
Y: 0 ~ 50mm
Z: 0 ~ 25mm (large sample stage 0 ~ 30mm)
R: 360°
T: -5° ~ 90° (large sample stage 0° ~ 90°)
Detector: Secondary electron detector, backscattered electron detector (optional), X-ray spectrometer (optional)
Vacuum system: molecular pump (optional diffusion pump)
Introduction
Scanning electron microscopy (SEM) is a microscopic morphology observation method between transmission electron microscope and optical microscope. It can directly use the material properties of the sample surface material for microscopic imaging.
