Features: 1. Simultaneous integration of the functions of Raman spectroscopy and atomic force microscopy, observation of the three-dimensional shape of the sample and analysis of the material components of the sample; 2. Built-in 10X apochromatic optical system, no need for focusing, at the same time see the probe tip and Raman laser spot; 3. Without moving the sample, AFM and Raman data can be collected from the same point at the same time, and the morphological information and chemical information of the sample can be detected in situ. 4. Laser detection head, laser coupler and sample scanning stand integrated, stable and reliable; 5. Precision laser and probe positioning device, replacement of probes and adjustment of light spot is simple and convenient; 6. The uniaxially driven sample automatically approaches the probe vertically and accurately positions the scanning area so that the needle tip is scanned perpendicular to the sample; 7. Motor control pressure electric ceramic automatic detection of intelligent needles, protection probes and samples; 8. Spring suspension type shockproof method, simple and practical, good shockproof effect; 9. Metal shield soundproof box, built-in high-precision temperature and humidity sensors, real-time monitoring of the working environment; 10. The integrated scanner hardware nonlinear correction user editor, nanometer characterization and measurement accuracy is better than 98%. Technical Parameters atomic force microscope: Operating modes: contact, tap, F-Z force curve measurement, RMS-Z curve measurement, friction/lateral force, amplitude/phase, magnetic force and electrostatic force Sample size: Φ ≤ 90mm, H ≤ 20mm Scan range: XY to 20um, Z to 2um (optional XY to 50um, Z to 5um) Scanning resolution: XY to 0.2nm, Z to 0.05nm Sample movement range: 0~20mm Optical magnification 10X, optical resolution 1um (optional 20X, optical resolution 0.8um) Scan rate 0.6Hz~4.34Hz, scan angle 0~360° Scan Control: XY uses 18-bit D/A, Z uses 16-bit D/A Data sampling: 14-bit A/D, dual 16-bit A/D multiplex simultaneous sampling Feedback method: DSP digital feedback Feedback sampling rate: 64.0KHz Communication interface: USB2.0/3.0 Operating environment: WindowsXP/7/8/10 operating system Raman spectrometer: Laser wavelength: 532±0.05nm, optional 785±0.05nm Laser continuous output power: >500Mw (50-600mW continuously adjustable) Laser wavelength stability: <0.05nm Laser power stability: <2% (within two hours) Laser life: >10000 hours Raman drift range: 50-4000cmˉ1 Spectral resolution: <3cmˉ1 Dynamic range: 8000:1 Integration time: 17 milliseconds to 100 seconds Linearity: >99.8% Operating environment: WindowsXP/7/8 operating system Automatic peak search: support Raman database: more than 3000 common data (optional), support upgrade Developed Raman Database: Support Raman data import and export: support Analysis Software: Raman Analysis 2
Features: 1. Simultaneous integration of the functions of Raman spectroscopy and atomic force microscopy, observation of the three-dimensional shape of the sample and analysis of the material components of the sample; 2. Built-in 10X apochromatic optical system, no need for focusing, at the same time see the probe tip and Raman laser spot; 3. Without moving the sample, AFM and Raman data can be collected from the same point at the same time, and the morphological information and chemical information of the sample can be detected in situ. 4. Laser detection head, laser coupler and sample scanning stand integrated, stable and reliable; 5. Precision laser and probe positioning device, replacement of probes and adjustment of light spot is simple and convenient; 6. The uniaxially driven sample automatically approaches the probe vertically and accurately positions the scanning area so that the needle tip is scanned perpendicular to the sample; 7. Motor control pressure electric ceramic automatic detection of intelligent needles, protection probes and samples; 8. Spring suspension type shockproof method, simple and practical, good shockproof effect; 9. Metal shield soundproof box, built-in high-precision temperature and humidity sensors, real-time monitoring of the working environment; 10. The integrated scanner hardware nonlinear correction user editor, nanometer characterization and measurement accuracy is better than 98%.
