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FM-NanoviewOp-AFM Optical Atomic Force Microscope for IC online testing

Product ID:GDXyzl004

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Supply Ability:20SETS/MON
Port:SHENZHEN
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  • Product Introduction
  • Consulting
  • Model NumberFM-NanoviewOp-AFM
    Brand NameSZFSM
    Payment TermsT/T, paypal
    Introduction:
    Multi-mode AFM has a wide range of applications, including:
    Material science: observing and studying material surfaces, including surface roughness and surface structure, particle size, and defects;
    Microelectronics: On-line detection of large-scale integrated circuits, studying the local electrical characteristics of ICs, and being used for information storage and reading of ultra-high-density (100 million times that of current disks)
    Biology: DNA, chromatin structure, protein/enzyme reactions, protein adsorption, etc.
    Medicine: a powerful means of mesoscopic operation, its application areas involve medicine, pharmacology, immunity, diagnosis and treatment and other disciplines
    Optics: The combination of optical technology and AFM technology can form a new discipline; near-field optics, which combines the unparalleled resolution of AFM technology in detecting topography with the advantages of optical field observations.
    Physics: AFM can detect the surface's electronic structure, energy level, wave function, tunneling effect and so on. Mesoscopic physics studies can be conducted to study the interaction of electrons with adsorbed atoms
    Chemistry: AFM can be used as an effective in-situ detection tool to study surface chemical reactions at the atomic level. It can also observe atomic-level changes in surface chemical reactions.
    Features:
    1. Integrated design of optical microscope and atomic force microscope, integration of photoelectric control;
    2. At the same time, there are optical and atomic force microscope imaging capabilities, both of which can be scanned at the same time without affecting each other.
    3. At the same time with optical two-dimensional measurement and atomic force microscope three-dimensional measurement function;
    4. The vertical light path design is adopted, and the gas-liquid dual-purpose probe frame can be used in air or liquid at the same time;
    5.Using high magnification optical positioning system to achieve precise positioning of probe and sample scanning area;
    6. Simple laser spot adjustment mode, real-time observation and adjustment of light spot through optical CCD window;
    7. The uniaxially driven sample automatically approaches the probe vertically and accurately positions the scanning area so that the needle tip is scanned perpendicular to the sample;
    8. Motor control pressure electric ceramic automatic detection of intelligent needles, protection probes and samples;
    9. Equipped with pneumatic shock-absorbing table, strong anti-interference ability, does not affect the operation of the instrument;
    10. The integrated scanner hardware nonlinear correction user editor, nanometer characterization and measurement accuracy is better than 98%.
    Technical Parameters
    Atomic force working modes: contact, tap, F-Z force curve measurement, RMS-Z curve measurement, friction/lateral force, amplitude/phase, magnetic force and electrostatic force, optional liquid mode
    Atomic force scanning range: XY to 20um, Z to 2um (optional XY to 50um, Z to 5um)
    Sample size: Φ ≤ 90mm, H ≤ 20mm
    Scanning resolution: XY to 0.2nm, Z to 0.05nm
    Sample movement range: 0~20mm
    Optical Objectives: 5X, 10X, 20X, 50X Plan Apochromatic
    Optical eyepiece: 10X
    CCD sensor: 3 million pixels
    Display: 11.6-inch flat panel display with measurement function
    Optical focusing method: electric focusing
    Scan rate 0.6Hz~4.34Hz, scan angle 0~360°
    Scan Control: XY uses 18-bit D/A, Z uses 16-bit D/A
    Data sampling: 14-bit A/D, dual 16-bit A/D multiplex simultaneous sampling
    Feedback method: DSP digital feedback
    Feedback sampling rate: 64.0KHz
    Communication interface: USB2.0/3.0
    Operating environment: WindowsXP/7/8/10 operating system

  • Introduction:
    Multi-mode AFM has a wide range of applications, including:
    Material science: observing and studying material surfaces, including surface roughness and surface structure, particle size, and defects;
    Microelectronics: On-line detection of large-scale integrated circuits, studying the local electrical characteristics of ICs, and being used for information storage and reading of ultra-high-density (100 million times that of current disks)
    Biology: DNA, chromatin structure, protein/enzyme reactions, protein adsorption, etc.
    Medicine: a powerful means of mesoscopic operation, its application areas involve medicine, pharmacology, immunity, diagnosis and treatment and other disciplines
    Optics: The combination of optical technology and AFM technology can form a new discipline; near-field optics, which combines the unparalleled resolution of AFM technology in detecting topography with the advantages of optical field observations.
    Physics: AFM can detect the surface's electronic structure, energy level, wave function, tunneling effect and so on. Mesoscopic physics studies can be conducted to study the interaction of electrons with adsorbed atoms
    Chemistry: AFM can be used as an effective in-situ detection tool to study surface chemical reactions at the atomic level. It can also observe atomic-level changes in surface chemical reactions.
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