| Range | Test Range | 0.0～10000mm(Longitudinal wave in steel), continuously adjustable and with the minimum step of 0.1mm |
| Material Velocity | 1000～15000m/s,continuously adjustable,built-in 30 sound velocity sets of commonly used material | |
| Pulse Shift | -20～3000μs | |
| Probe Zero | 0～999.9μs | |
| Transmitting Pulse | Transmitting Pulse Mode | Negative spike wave |
| Pulse Repetition Frequency | 25～400Hz,automatic or manual adjustment | |
| Transmitting Energy | High(600V) or low(300V) | |
| Working Mode | Single or double | |
| Damping | 400、150、80、60Ω | |
| Receive and Magnify | Sampling Frequency | 160MHz based on the hardware |
| Up to 640MHz by improving digital signal processing when the detection range is less than 8mm (Longitudinal wave in steel) | ||
| Gain | 0.0～110.0dB in the steps of 0.1/1.0/2.0/6dB，Provides intelligent and fast adjustment function | |
| Spectrum band | 0.2～20MHz, choice of broadband or narrowband | |
| Gate | Two gates, full-screen display respectively and adjustable | |
| Measuring Mode | Select front edge or peak of pulse wave in gate | |
| Rectification | Full wave,negative and positive half wave, RF | |
| Reject | 0～99% | |
| Unit | mm and μs | |
| Alarm | Alarm Mode | Hardware alarm: selectable coincidence or anticoincidence wave alarm, the minimum thickness alarm and DAC alarm |
| Alarm Signal | Acoustic-optical alarm: buzzer and LED lighting diode | |
| Display | Display Screen | Hi-resolution TFT color display screen |
| 6.5"Ultra-large display screen | ||
| Adjustable and high brightness | ||
| 262144 colors | ||
| Display Zone | 640×480 dot-matrix | |
| Pulse waveform display:450×400 dot-matrix | ||
| Work piece across section scanning display:450×320 dot-matrix | ||
| Screen Refresh Rate | 60Hz | |
| Pulse Wave Represent Mode | Color display,selectable filled or hollow display | |
| Control and Interface | Keyboard | Membrane panel |
| Waterproof, dustproof, anti-fouling, acid and alkali-resisting, high tigh | ||
| Slightly raised key-press with excellent tactility | ||
| Convenient key-press position for easy operating | ||
| Standard symbol, Chinese | ||
| Menus | Chinese menus | |
| Single key direct control for commonly used menus | ||
| Divide into classes or groups for the other menus | ||
| Chinese Input Method | Pinying, capital letters, lower case letters and numbers | |
| Keyboard entry | ||
| Single hand operation | ||
| Operation method like that of mobile phone | ||
| Probe Interface | Two 00# Lemo@ probe sockets situated on the top of the instrument | |
| BNC Q9 probe socket(if need,it should be noted in order form) | ||
| Computer and Printer Interface | High speed USB interface | |
| RS232 serial interface | ||
| 25-pin parallel print port | ||
| Data Storage | Shortcut Channel | 10 shortcut channels |
| The data sets of the 10 shortcut channels can be stored prior to test | ||
| Can be edited, stored, recalled and reviewed | ||
| Display the number of the shortcut channels in the front of waveform zone with clear counter boldface characters | ||
| Replace probe quickly | ||
| Parameters | 100 data sets can be stored | |
| Can be stored, recalled, reviewed, printed and communicated | ||
| Test Report | 1000 data sets including waveforms can be stored | |
| The waveform can be recalled and displayed on the background of the screen for comparing the real time waveform | ||
| Can be stored, recalled, reviewed, printed and communicated | ||
| The items such as file name and operator can be edited | ||
| B Scan Picture | Up to 20 pictures can be stored (color picture) | |
| B scan picture can be added to the test report | ||
| Can be stored,browsed,printed and communicated | ||
| Continuous Recording Waveform | Video continuously recording waveform on the screen | |
| Recording time of 24 minutes | ||
| Can be reviewed and communicated | ||
| Thickness Measurement | Up to 1000 thickness measurement results can be stored in different groups | |
| The unit, minimum and maximum thickness limitations should be the same in a group | ||
| Can be edited,reviewed,printed and communicated | ||
| Auxiliary Functions | Freeze | Freeze A scan waveform |
| Can adjust the parameters which are independent of the waveform position and height after freezing | ||
| Frozen waveform can be placed on the background of the display area for comparing with the real-time waveform | ||
| Single key direct control | ||
| Peak Value | Capture the highest point of waveform in gate | |
| Display the highest waveform amplitude | ||
| Calibrate the highest echo from the artificial flaw or defect | ||
| Single key direct control | ||
| Envelope | Display the envelope line of the waveform in gate | |
| Expandability | Enlarge the waveform in gate to full display area | |
| For observe the waveform conveniently | ||
| Store Shortcut Key | One of the commonly used key on panel | |
| Can store parameters, test report, B scan and waveform recording | ||
| Single key control | ||
| Automatic Gain | Waveform amplitude in gate can be preset to a desired value | |
| The preset range of 5%~100% | ||
| Waveform Contrast | The frozen waveform can be placed on the background of the display screen | |
| The stored waveform can be placed on the background of the display screen | ||
| The real-time waveforms can be compared the waveform displayed on the background of the display screen | ||
| Calibration | Automatically calibrate normal probe’s zero offset | |
| Automatically calibrate angle probe’s zero offset and K value (refraction angle) | ||
| Automatic Measuring Instrument’s Main Specification |
Vertical Linearity Error | |
| Sensitivity Surplus | ||
| Resolution | ||
| Dynamic Range | ||
| Electric Noise Level | ||
| Locating Flaw | Display the flaw depth using normal probe | |
| Display flaw horizontal position and depth, sound path and wave times using angle beam probe | ||
| Locating flaw method: front edge or peak | ||
| Quantitative Flaw | Display waveform amplitude (%) in common testing mode | |
| Display waveform amplitude (%) and dB over SL in DAC testing mode | ||
| Display amplitude (%) and equivalent (Ф) in AVG testing mode | ||
| Automatic Measuring Crack’s Height | Automatically calculate the height of crack of work piece such as weld | |
| Reject | Linearity reject without influence on instrument’s specification | |
| Screen Protection | Save power for long time operation | |
| Matching Probe | Provides two steps of transmitting energy and four steps of damping | |
| Various probes can be matched | ||
| Excellent sensitivity and resolution with no receiving waveform distortion | ||
| Curved Surface Correction | Suitable for testing internal and external curved surface | |
| Automatically correct flaw detection results according to the diameter of curved surface | ||
| DAC Curve (see attached figure A) |
Up to 99 points can be recorded | |
| Each point can be edited and deleted,inserted | ||
| Include three additional curves (evaluation curve, quantitative curve and judge waste curve | ||
| Each point can be connected with folding line or smooth line | ||
| Can be shifted according to the change of dB and range etc | ||
| Can be created, edited, stored, deleted and recalled | ||
| AVG Curve (see attached figure B) |
Suitable for detecting forge etc | |
| Only need to record a reference point | ||
| Obtain the other quantitative AVG curves according to the diameter of flat bottom hole of a reference point | ||
| Can be created, edited, stored, deleted and recalled | ||
| Specifications | Vertical Linearity Error | ≤3% |
| Horizontal Linearity Error | ≤0.1% | |
| Sensitivity Surplus | ＞60dB(200Ф2 flat bottom hole) | |
| Resolution | ＞36dB | |
| Dynamic Range | ≥32dB | |
| Electric Noise Level | ＜10% |
Please inquire
