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Range | Test Range | 0.0~10000mm(Longitudinal wave in steel), continuously adjustable and with the minimum step of 0.1mm |
Material Velocity | 1000~15000m/s,continuously adjustable,built-in 30 sound velocity sets of commonly used material | |
Pulse Shift | -20~3000μs | |
Probe Zero | 0~999.9μs | |
Transmitting Pulse | Transmitting Pulse Mode | Negative spike wave |
Pulse Repetition Frequency | 25~400Hz,automatic or manual adjustment | |
Transmitting Energy | High(600V) or low(300V) | |
Working Mode | Single or double | |
Damping | 400、150、80、60Ω | |
Receive and Magnify | Sampling Frequency | 160MHz based on the hardware |
Up to 640MHz by improving digital signal processing when the detection range is less than 8mm (Longitudinal wave in steel) | ||
Gain | 0.0~110.0dB in the steps of 0.1/1.0/2.0/6dB,Provides intelligent and fast adjustment function | |
Spectrum band | 0.2~20MHz, choice of broadband or narrowband | |
Gate | Two gates, full-screen display respectively and adjustable | |
Measuring Mode | Select front edge or peak of pulse wave in gate | |
Rectification | Full wave,negative and positive half wave, RF | |
Reject | 0~99% | |
Unit | mm and μs | |
Alarm | Alarm Mode | Hardware alarm: selectable coincidence or anticoincidence wave alarm, the minimum thickness alarm and DAC alarm |
Alarm Signal | Acoustic-optical alarm: buzzer and LED lighting diode | |
Display | Display Screen | Hi-resolution TFT color display screen |
6.5"Ultra-large display screen | ||
Adjustable and high brightness | ||
262144 colors | ||
Display Zone | 640×480 dot-matrix | |
Pulse waveform display:450×400 dot-matrix | ||
Work piece across section scanning display:450×320 dot-matrix | ||
Screen Refresh Rate | 60Hz | |
Pulse Wave Represent Mode | Color display,selectable filled or hollow display | |
Control and Interface | Keyboard | Membrane panel |
Waterproof, dustproof, anti-fouling, acid and alkali-resisting, high tigh | ||
Slightly raised key-press with excellent tactility | ||
Convenient key-press position for easy operating | ||
Standard symbol, Chinese | ||
Menus | Chinese menus | |
Single key direct control for commonly used menus | ||
Divide into classes or groups for the other menus | ||
Chinese Input Method | Pinying, capital letters, lower case letters and numbers | |
Keyboard entry | ||
Single hand operation | ||
Operation method like that of mobile phone | ||
Probe Interface | Two 00# Lemo@ probe sockets situated on the top of the instrument | |
BNC Q9 probe socket(if need,it should be noted in order form) | ||
Computer and Printer Interface | High speed USB interface | |
RS232 serial interface | ||
25-pin parallel print port | ||
Data Storage | Shortcut Channel | 10 shortcut channels |
The data sets of the 10 shortcut channels can be stored prior to test | ||
Can be edited, stored, recalled and reviewed | ||
Display the number of the shortcut channels in the front of waveform zone with clear counter boldface characters | ||
Replace probe quickly | ||
Parameters | 100 data sets can be stored | |
Can be stored, recalled, reviewed, printed and communicated | ||
Test Report | 1000 data sets including waveforms can be stored | |
The waveform can be recalled and displayed on the background of the screen for comparing the real time waveform | ||
Can be stored, recalled, reviewed, printed and communicated | ||
The items such as file name and operator can be edited | ||
B Scan Picture | Up to 20 pictures can be stored (color picture) | |
B scan picture can be added to the test report | ||
Can be stored,browsed,printed and communicated | ||
Continuous Recording Waveform | Video continuously recording waveform on the screen | |
Recording time of 24 minutes | ||
Can be reviewed and communicated | ||
Thickness Measurement | Up to 1000 thickness measurement results can be stored in different groups | |
The unit, minimum and maximum thickness limitations should be the same in a group | ||
Can be edited,reviewed,printed and communicated | ||
Auxiliary Functions | Freeze | Freeze A scan waveform |
Can adjust the parameters which are independent of the waveform position and height after freezing | ||
Frozen waveform can be placed on the background of the display area for comparing with the real-time waveform | ||
Single key direct control | ||
Peak Value | Capture the highest point of waveform in gate | |
Display the highest waveform amplitude | ||
Calibrate the highest echo from the artificial flaw or defect | ||
Single key direct control | ||
Envelope | Display the envelope line of the waveform in gate | |
Expandability | Enlarge the waveform in gate to full display area | |
For observe the waveform conveniently | ||
Store Shortcut Key | One of the commonly used key on panel | |
Can store parameters, test report, B scan and waveform recording | ||
Single key control | ||
Automatic Gain | Waveform amplitude in gate can be preset to a desired value | |
The preset range of 5%~100% | ||
Waveform Contrast | The frozen waveform can be placed on the background of the display screen | |
The stored waveform can be placed on the background of the display screen | ||
The real-time waveforms can be compared the waveform displayed on the background of the display screen | ||
Calibration | Automatically calibrate normal probe’s zero offset | |
Automatically calibrate angle probe’s zero offset and K value (refraction angle) | ||
Automatic Measuring Instrument’s Main Specification |
Vertical Linearity Error | |
Sensitivity Surplus | ||
Resolution | ||
Dynamic Range | ||
Electric Noise Level | ||
Locating Flaw | Display the flaw depth using normal probe | |
Display flaw horizontal position and depth, sound path and wave times using angle beam probe | ||
Locating flaw method: front edge or peak | ||
Quantitative Flaw | Display waveform amplitude (%) in common testing mode | |
Display waveform amplitude (%) and dB over SL in DAC testing mode | ||
Display amplitude (%) and equivalent (Ф) in AVG testing mode | ||
Automatic Measuring Crack’s Height | Automatically calculate the height of crack of work piece such as weld | |
Reject | Linearity reject without influence on instrument’s specification | |
Screen Protection | Save power for long time operation | |
Matching Probe | Provides two steps of transmitting energy and four steps of damping | |
Various probes can be matched | ||
Excellent sensitivity and resolution with no receiving waveform distortion | ||
Curved Surface Correction | Suitable for testing internal and external curved surface | |
Automatically correct flaw detection results according to the diameter of curved surface | ||
DAC Curve (see attached figure A) |
Up to 99 points can be recorded | |
Each point can be edited and deleted,inserted | ||
Include three additional curves (evaluation curve, quantitative curve and judge waste curve | ||
Each point can be connected with folding line or smooth line | ||
Can be shifted according to the change of dB and range etc | ||
Can be created, edited, stored, deleted and recalled | ||
AVG Curve (see attached figure B) |
Suitable for detecting forge etc | |
Only need to record a reference point | ||
Obtain the other quantitative AVG curves according to the diameter of flat bottom hole of a reference point | ||
Can be created, edited, stored, deleted and recalled | ||
Specifications | Vertical Linearity Error | ≤3% |
Horizontal Linearity Error | ≤0.1% | |
Sensitivity Surplus | >60dB(200Ф2 flat bottom hole) | |
Resolution | >36dB | |
Dynamic Range | ≥32dB | |
Electric Noise Level | <10% |