XJCM-11 semi-automatic solar cell tester Introduction:
The XJCM-11 semi-automatic solar cell tester uses a unique downlighting mode to simulate sunlight using a xenon lamp. This device is compatible with testing multi-main grid cells. The three core performance indicators of equipment non-uniformity, spectral matching degree and light intensity stability are both higher than the international highest standard (IEC 60904-9 2007). The spectral range is extended from 400-1100nm to 300-1200nm, and the energy output of the wider spectrum truly reflects the responsiveness of the components in the ultraviolet and infrared bands. Achieve full spectrum testing of high-efficiency crystalline silicon cells, and test accuracy is greatly improved. The test pulse width is extended from 10ms to 150ms, which can solve the test deviation caused by the large capacitance effect, and can accurately test the technical wafers such as ordinary crystal silicon, PERC, N type, HIT, GIGS, etc.
Test object: It is suitable for testing and recording the results of ordinary solar crystal silicon components and high-performance components. Technical Parameters:
Model: XJCM-11 (A+A+A+)
Maximum measurable area: 160X160mm
Lamp life: 60,000 flashes
Amplitude range: 700-1200W/m2
Spectral matching: 0.875-1. 125
Amplitude illuminance instability: ≤0.5%
Amplitude unevenness: ≤1%
Spectral range: 300-1200nm
Measuring range: Voltage 1v/10v/50v/100v Current 0.25A/1A/2.5A/10A
Constant light time: 10-150ms
Test interval: 3~10s
Lighting mode: light up
Power requirements: AC 200-240V, 10A, 50/60Hz
Air source requirements: 600Kpa 100L/min
Voltage range (V): 0-1V
Current range (A) : 0-0.25/1/5/12.5A/20A
Dimensions (length x width x height): 1,220mm × 660mm × 1,600mm
Equipment weight: 240Kg
Introduction:
The XJCM-11 semi-automatic solar cell tester uses a unique downlighting mode to simulate sunlight using a xenon lamp. This device is compatible with testing multi-main grid cells. The three core performance indicators of equipment non-uniformity, spectral matching degree and light intensity stability are both higher than the international highest standard (IEC 60904-9 2007). The spectral range is extended from 400-1100nm to 300-1200nm, and the energy output of the wider spectrum truly reflects the responsiveness of the components in the ultraviolet and infrared bands. Achieve full spectrum testing of high-efficiency crystalline silicon cells, and test accuracy is greatly improved. The test pulse width is extended from 10ms to 150ms, which can solve the test deviation caused by the large capacitance effect, and can accurately test the technical wafers such as ordinary crystal silicon, PERC, N type, HIT, GIGS, etc.
Test object: It is suitable for testing and recording the results of ordinary solar crystal silicon components and high-performance components.
