Brief introduction
X -ray diffraction is the most widespread application of X -ray diffraction analysis instruments. X -ray diffraction is mainly used in the sample
Product phase qualitative or quantitative analysis , the crystal structure analysis , the determination of macroscopic stress structural material , large grains
Small measured crystallinity determination , etc., can be installed in accordance with the actual needs of a variety of special features and accessories appropriate control and
Computer software , consisting diffractometer with special functions . Main features:
Crystal orientation can be determined accurately measured lattice constants , the determination of grain size , performed substances phase qualitative and quantitative analysis , but also on the surface of a thin film of metal and other materials were tested. Technical parameters:
Maximum power : 3 kW
Angle measurement repeatability : ≤0.0016 °
Scan range : -30 ° ~ 160 °
Resolution : ≤0.09 °
Angle measurement accuracy : ≤ 0.0052 ° (2θ)
Brief introduction
X -ray diffraction is the most widespread application of X -ray diffraction analysis instruments. X -ray diffraction is mainly used in the sample
Product phase qualitative or quantitative analysis , the crystal structure analysis , the determination of macroscopic stress structural material , large grains
Small measured crystallinity determination , etc., can be installed in accordance with the actual needs of a variety of special features and accessories appropriate control and
Computer software , consisting diffractometer with special functions .
