XAD-200 high-end fully automatic film thickness gauge Introduction: The XAD-200 is an all element illuminated fluorescence spectrometer that retains the film thickness performance of a dedicated thickness gauge for detecting small samples and grooves, while also meeting the requirements of RoHS harmful element detection and composition analysis. It is equipped with a fully automatic platform to achieve XYZ axis programming displacement and unmanned multi-point measurement. The measurement software is equipped with advanced EFP algorithm and spectral analysis technology, solving many industry problems. Widely used for quality control of various products, incoming material inspection, and measurement of production process control. Features: 1. Detection: The measurement area is as small as 0.008mm2 2. Zoom device algorithm: The measurement distance can be changed to measure concave convex irregular samples, and the zoom distance can reach 0-90mm 3. Independently developed EFP algorithm: composition analysis of AI (3) - U (92) elements, detection of Li (3) - U (92) element coatings, multi-layer and multi-element measurements, and even accurate measurement of the same element in different layers 4. Advanced spectral analysis technology: reduces the interference of elements with similar energy and lowers the detection limit 5. High performance detector: SDD silicon drift window area 20/50mm2 detector 6. X-ray device: Microfocus enhanced X-ray tube with focusing device 7. Illuminated design: achieving fast, accurate, stable, and efficient measurement of large samples or dense points 8. Programmable automatic displacement: optional automatic platform, unmanned automatic measurement within X210 * Y230 * Z145mm stroke 9. Automatic switching of multiple collimators Technical parameters: 1. Scope of composition analysis: Aluminum (Al) - Uranium (U) 2. Component detection limit: 1ppm 3. Analysis range of coating: Lithium (Li) - Uranium (U) 4. Detection limit of coating layer: 0.005 μ M 5. Measure the diameter as small as □ 0.1 * 0.3mm (measurement area as small as 0.03mm2) Standard configuration: Measuring diameter as small as 0.3mm (measuring area as small as 0.07mm2) 6. Focusing distance: 0-30mm 7. Sample chamber size: 530mm * 570mm * 150mm 8. Instrument size: 550mm * 760mm * 635mm 9. Instrument weight: 100KG 10. XY axis workbench movement range: 100mm * 150mm 11. XY axis workbench bearing capacity: 15KG
Introduction: The XAD-200 is an all element illuminated fluorescence spectrometer that retains the film thickness performance of a dedicated thickness gauge for detecting small samples and grooves, while also meeting the requirements of RoHS harmful element detection and composition analysis. It is equipped with a fully automatic platform to achieve XYZ axis programming displacement and unmanned multi-point measurement. The measurement software is equipped with advanced EFP algorithm and spectral analysis technology, solving many industry problems. Widely used for quality control of various products, incoming material inspection, and measurement of production process control.
