model | TS-W1 | TS-W2 | TS-W3 | TS-W4 |
Theoretical basis | Mie scattering theory | |||
Particle size measurement range | 0.1-200um | 0.1-400um | 0.1-600um | 0.1-1000um |
light source | Semiconductor refrigeration thermostat control red light solid laser light source, wavelength 635nm | |||
Repeatability error | <1% (standard D50 deviation) | |||
Measurement error | <1% (standard D50 deviation, using national standard particle test) | |||
Detector | 32 or 48 channel silicon photodiode WIN 10 system, 30GB hard drive capacity, 2GB system memory |
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Sample cell | Fixed sample cell (10mL), circulating sample cell (500mL, built-in ultrasonic dispersion device) | |||
Measurement analysis time | Less than 1 minute under normal conditions (from the start of the measurement to the display of the analysis results) | |||
Output content | Volume, quantity differential distribution and cumulative distribution tables and charts; various statistical average diameters; operator information; experimental sample information, dispersion media information, etc. | |||
Display method | Embedded 10.8-inch industrial grade computer, can be connected to keyboard, mouse, U disk | |||
computer system | WIN 10 system, 30GB hard drive capacity, 2GB system memory | |||
power supply | 220V,50 Hz |