model |
TS-W1 |
TS-W2 |
TS-W3 |
TS-W4 |
Theoretical basis |
Mie scattering theory |
Particle size measurement range |
0.1-200um |
0.1-400um |
0.1-600um |
0.1-1000um |
light source |
Semiconductor refrigeration thermostat control red light solid laser light source, wavelength 635nm |
Repeatability error |
<1% (standard D50 deviation) |
Measurement error |
<1% (standard D50 deviation, using national standard particle test) |
Detector |
32 or 48 channel silicon photodiode WIN 10 system, 30GB hard drive capacity, 2GB system memory |
Sample cell |
Fixed sample cell (10mL), circulating sample cell (500mL, built-in ultrasonic dispersion device) |
Measurement analysis time |
Less than 1 minute under normal conditions (from the start of the measurement to the display of the analysis results) |
Output content |
Volume, quantity differential distribution and cumulative distribution tables and charts; various statistical average diameters; operator information; experimental sample information, dispersion media information, etc. |
Display method |
Embedded 10.8-inch industrial grade computer, can be connected to keyboard, mouse, U disk |
computer system |
WIN 10 system, 30GB hard drive capacity, 2GB system memory |
power supply |
220V,50 Hz |