Introduction: TF-5500 X-ray Diffraction / Total Reflection Fluorescence Spectrometer is a new generation multi-function analysis instrument newly developed by our company. It can perform both X-ray diffraction and total reflection fluorescence spectroscopy. It can analyze many samples including liquid, Films, pellets, biological fluids, tissue samples, pigments, inks, paints, semiconductors and the like. Analytical elements: atomic number 11-92., That Na-U. Features: Total reflectance fluorescence allows for simultaneous XRF (45 degree incidence) analysis; no memory effect, no matrix effect, complete suppression of the signal from the substrate, especially for thin film samples, powder samples, liquid sample analysis and testing; quantitative analysis of Common XRF simplicity; multi-element ultra-trace analysis (ppb-ppm orders of magnitude) with dynamic range from one part per million to one percent; non-destructive analysis without sample pretreatment; no liquid nitrogen cooling and low running costs A multi-purpose machine can not only analyze the crystal structure of the sample, but also analyze the composition and impurity content of the sample, and can also perform small-angle XRD diffraction to greatly reduce the equipment cost. Technical Parameters X-ray tube (domestic or imported) Target type: Cu, Fe, Co, Cr, Mo, Ag, W and other targets optional Focus: 1 × 10mm2 or 0.4 × 14mm2 Maximum output power: 2.2kW or 2.4kW X-ray generator (PLC control) Maximum output power: 3kW X-ray tube voltage: 10 ~ 50kV X-ray tube current: 2 ~ 60mA Minimum voltage and current control step width: 1kV / step, 1mA / step Output stability: ≤ 0.01% (power fluctuations of 10%) Goniometer Goniometer structure: vertical goniometer θs-θd structure Goniometer scanning radius: Standard 225mm (150 ~ 225mm adjustable) Scanning range: -35 ° ~ 170 ° Scanning speed: 0.006 ~ 120 ° / min Scanning method: θs-θd linkage, θs or θd single action Work: step, continuous, sub-scan Minimum step angle: 0.0001 ° Measurement accuracy: ≤ 0.0002 ° 2θ angle repeatability: 0.0005 ° Angle positioning speed: 1500 ° / min (2θ) Recording control unit (detector) Detector Type: SDD Detector for Proportional (PC) or Scintillation (SC) Fluorescence Maximum linear count rate: 1 × 107CPS (noise ≤ 1CPS) Spectral resolution: ≤20% (PC) or ≤50% (SC) ≤12% (SDD) Work: PLC automatic control differential, integral mode conversion, automatic PHA, dead time correction High pressure detector: 0 ~ 2100VDC or 0 ~ 1100VDC continuously adjustable High pressure stability: better than 0.005%
Introduction: TF-5500 X-ray Diffraction / Total Reflection Fluorescence Spectrometer is a new generation multi-function analysis instrument newly developed by our company. It can perform both X-ray diffraction and total reflection fluorescence spectroscopy. It can analyze many samples including liquid, Films, pellets, biological fluids, tissue samples, pigments, inks, paints, semiconductors and the like. Analytical elements: atomic number 11-92., That Na-U.
