Brief introduction X -ray diffraction is the most widespread application of X -ray diffraction analysis instruments. X -ray diffraction is mainly used in the sample
Product phase qualitative or quantitative analysis , the crystal structure analysis , the determination of macroscopic stress structural material , large grains
Small measured crystallinity determination , etc., can be installed in accordance with the actual needs of a variety of special features and accessories appropriate control and
Computer software , consisting diffractometer with special functions . Main features: 1. Imported programmable logic controller (PLC) technology, which really control , interference , and can achieve high-voltage control section without failure rate.
2.PLC and computer interface , enabling direct control of the instrument computer terminal pressure switch , lift and shutter switch. A higher degree of automation of the instrument . More stable performance.
3. protection function, which can effectively prevent damage to the instrument of some external factors .
4. The X -ray tube with an automatic training function . In the process of opening the high-pressure high-voltage direct lift , do not need to re- close the high pressure operation to extend the life of the X-ray tube and the instrument. Technical parameters: 1. Tube voltage : 10 ~ 60kV automatically controlled by a computer terminal (1kV / step);
2. Tube current : 2 ~ 80mA automatically controlled by a computer terminal (1mA / step);
3. The tube voltage , tube current stability ≤0.01%;
The rated output power : 3kW;
5. overvoltage, overcurrent , over power , no pressure , anhydrous , X-ray tube over-temperature protection ; 6. shutter switch automatically controlled by computer terminals ;
7. The system integrated stability ≤0.3%;
8. protection system for double protection , and window shutters and shield connections, lead shutter automatically closes the door opened up to the national radiation protection standards, no more than 0.2μSv / h.;
Brief introduction X -ray diffraction is the most widespread application of X -ray diffraction analysis instruments. X -ray diffraction is mainly used in the sample
Product phase qualitative or quantitative analysis , the crystal structure analysis , the determination of macroscopic stress structural material , large grains
Small measured crystallinity determination , etc., can be installed in accordance with the actual needs of a variety of special features and accessories appropriate control and
Computer software , consisting diffractometer with special functions .
