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model | KLT-11 | KLT-21 | KLT-31 | KLT-41 |
Measuring range | 0.1-200um | 0.1-400um | 0.1-600um | 0.1-1000um |
measuring principle | Mie scattering principle | |||
Measurement analysis time | Less than 1 minute under normal conditions (from the start of the measurement to the display of the analysis results) | |||
Reproducibility | <1% (standard D50 deviation) | |||
measurement accuracy | <1% (standard D50 deviation) (national standard particle inspection) | |||
Light source | Semiconductor refrigeration constant temperature laser source, wavelength 635nm | |||
Detector | Custom silicon photodiode | |||
Communication Interface | USB interface | |||
Sample cell | Fixed sample cell and circulating sample cell | |||
power supply | AC 180V-240V, 50Hz, 20W | |||
Dimensions | 650*350*420 | |||
weight | 30kg |