GIVE-M2 IV+EL all-in-one Introduction: GIVE-M2 brings together Shaanxi Zhongsen's extensive experience in solar simulators and EL defect detectors, enabling one machine to simultaneously have two completely different types of test functions, which can simultaneously measure the electrical properties and EL defects of solar cell modules. Testing requirements. This equipment can reduce component production costs, increase production efficiency, and component quality. A single feed, one wiring, one beat, one person saved, one space saved, and one process saved. This device is an indispensable testing device for battery component manufacturers to achieve long-term benefits. testing object: 1. Applicable to the test and result record of solar crystal silicon components and battery component electrical performance parameters. 2. Applicable to solar crystal silicon components and battery components to detect the presence or absence of screen printing plugging, material defects, sintering defects (wave texture), edge short circuit, process contamination and process fixture contamination and other defects and results records. Technical Parameters: Model GIVE-M2 Maximum measurable area 2000x2000mm Amplitude range 700-1200W/m2 Spectral matching 0.875-1.125 (A+ level) Amplitude illuminance <1% (A+ level) Amplitude unevenness <1% (A+ grade) Exposure time 0-30s Pixel 4928×3264 Dimensions 5800X2500X2500mm (excluding darkroom bracket height, ie chain height) Working power supply AC380V, 10A, 50/60HZ
Introduction: GIVE-M2 brings together Shaanxi Zhongsen's extensive experience in solar simulators and EL defect detectors, enabling one machine to simultaneously have two completely different types of test functions, which can simultaneously measure the electrical properties and EL defects of solar cell modules. Testing requirements. This equipment can reduce component production costs, increase production efficiency, and component quality. A single feed, one wiring, one beat, one person saved, one space saved, and one process saved. This device is an indispensable testing device for battery component manufacturers to achieve long-term benefits. testing object: 1. Applicable to the test and result record of solar crystal silicon components and battery component electrical performance parameters. 2. Applicable to solar crystal silicon components and battery components to detect the presence or absence of screen printing plugging, material defects, sintering defects (wave texture), edge short circuit, process contamination and process fixture contamination and other defects and results records.
