Brief introduction: Industrial computed tomography (CT) non-destructive testing system based on radiation imaging technology as the core, such as nuclear technology, precision machinery, computers, control set in the integration of advanced nondestructive testing equipment. Industrial computed tomography (CT) non-destructive testing system can be given by CT images to detect objects, objects internal structure, the density distribution and location of defects, the object to be measured can be internal structure and defect quantitative detection. Industrial computed tomography (CT) can be used for quantitative detection of internal defects in parts and whole, checking the correctness of assembly, which can realize mechanical inversion, the engineering application, has been widely used in aerospace, aviation, weapons, railway, shipbuilding, electronics, machinery, and many other fields. This series of industrial computed tomography (CT) non-destructive testing system can be equipped with different energy X-ray machine, equipped with array detectors or linear array detector. Can be combined using gamma ray source and detector to meet the needs of different detection. Technical indicators: Scanning mode: the second generation + three generations, DR Gamma ray source energy: 0 ~ 450 kv The spatial resolution: 1 ~ 2.5 lp/mm Density resolution: better than 0.5% Ct scan time: 2 ~ 12 minutes Ambient temperature: 5 ℃ ~ 35 ℃ Environmental humidity: 85% or less Detection range (length, diameter, weight) : can be customized
Brief introduction: Industrial computed tomography (CT) non-destructive testing system based on radiation imaging technology as the core, such as nuclear technology, precision machinery, computers, control set in the integration of advanced nondestructive testing equipment. Industrial computed tomography (CT) non-destructive testing system can be given by CT images to detect objects, objects internal structure, the density distribution and location of defects, the object to be measured can be internal structure and defect quantitative detection.