F-PZ1030 polarization experiment device Introduction: The high stability semiconductor laser is used as the light source, which effectively solves the error caused by the fluctuation of the light intensity and the change of the polarization state during the measurement process. In the power measurement process, the use of the adjustable range is beneficial to eliminate the shift error. The adjustable range has unique advantages in the relative light intensity measurement, such as power variation measurement and light intensity distribution measurement. Polarization experiment: Observing the transverse wave characteristics of the light, semiconductor laser Polarization characteristics and degree of polarization. Verify Marius's law. Birefringence characteristics of crystals, quarter-wave plate, 1/2 wave plate Polarization phenomena and theories such as optical rotation characteristics and optical rotation of optically active crystals. Technical Parameters: Optical experiment guide rail: 800mm, Semiconductor laser: 650 nm, 4 mW. Laser power indicator: three and a half digital meter, range: 200μW, 2mW, 20mW, 200mW, adjustable file. The minimum resolution is 0.1u W. 1/4 wave plate (including frame): 360 degree adjustable, minimum scale 1 degree, clear aperture 27mm. 1/2 wave plate (including frame): 360 degree adjustable, minimum scale 1 degree, clear aperture 27mm. Quartz optical accessories (including frame): three-dimensional, 360-degree adjustable, minimum scale 1 degree, clear aperture 22mm, thickness 3mm. Liquid optical cell accessories: L = 100mm, clear aperture; 20mm.
Introduction: The high stability semiconductor laser is used as the light source, which effectively solves the error caused by the fluctuation of the light intensity and the change of the polarization state during the measurement process. In the power measurement process, the use of the adjustable range is beneficial to eliminate the shift error. The adjustable range has unique advantages in the relative light intensity measurement, such as power variation measurement and light intensity distribution measurement.
