1 Sales ECA-ZT02 Plant Stomatal Gauge,Manufacturer

ECA-ZT02 Plant Stomatal Gauge

Product ID:SHZWdsl002

Price: Please inquire PDF Format
Supply Ability:50 SETS/MON
Port:SHENZHEN
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  • Product Introduction
  • Consulting
  • Model NumberECA-ZT02
    Brand NameYIKANGNONG
    Payment TermsTT,PAYPAL
    ECA-ZT02 Plant Stomatal Gauge
    Introduction:
    The ECA-ZT02 plant stomatometer uses steady-state technology to measure the stomatal conductance of leaves. Firstly, measure the water vapor pressure and water vapor flux on the surface of the blade. The plant stomatometer measures the vapor pressure at two locations in the diffusion pathway, and then calculates the flux, vapor pressure gradient, and conductivity of the diffusion pathway.
    Features:
    1. No pipeline channels, pumps, and fans, eliminating sources of error
    2. Small in size, light in weight, portable and easy to operate.
    3. Non destructive measurement
    4. Low price, high cost-effectiveness, low usage cost, and convenient maintenance.
    5. Wide applicability: It can be widely used for measuring different shaped leaves of various plants such as field crops, fruit trees, vegetables, forests, and grasses
    Technical parameters:
    Working environment: temperature 0-50 , relative humidity 0-100% (no water vapor condensation);
    Power supply: 4 No. 5 alkaline batteries, lifespan: ≥ 3 years;
    Data storage: 4G SD card, 100000 measurement data;
    Display: Approximately 30mm × 60mm, approximately 128 × 64 character LCD display;
    Range 0~1000 mmol • m-2 • s-1, accuracy 10%
    Measurement aperture: ≤ 6.3mm
    Instrument size: 165mm * 75mm * 30mm
    Sensor head cable: 1.2m
    Data interface: 9-pin RS-232 interface
    Keyboard: 6-key, sealed
    Measurement time in automatic mode: ≤ 30s.

  • Introduction:
    The ECA-ZT02 plant stomatometer uses steady-state technology to measure the stomatal conductance of leaves. Firstly, measure the water vapor pressure and water vapor flux on the surface of the blade. The plant stomatometer measures the vapor pressure at two locations in the diffusion pathway, and then calculates the flux, vapor pressure gradient, and conductivity of the diffusion pathway.
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