Product introduction: E-B130 video microscope, the perfect combination of HD megapixel CCD zoom lens and fine achievements, large field of view E-B130 video microscope, and work in a variety of distance can be imaged clearly, meet the needs of a variety of detection, the optical detection is more flexible; inhibit glare, edge enhancement and other functions, to adapt to the detection of the products of different materials; widely used in semiconductor, SMT, metal and plastic and other fields, to meet the detection of surface defects detection, process analysis. Characteristic： HD 1 million 300 thousand pixels, with a resolution of 1280*1024; Fine tuned zoom optical system to meet the various working range of clear imaging; The large field of view, the minimum field of view 8mm, the multiple and the field of view changes according to the working distance; With the suppression of strong light, edge enhancement, the imaging effect is more superior; Unique light source, LED light source can adjust the lighting angle; Technical parameter: Model: E-B130 Pixels: 1 million 300 thousand pixels Resolving power: 1280*1024 Frame rate: 60/fps Optical magnification: 0.5x (WD=63mm) Working distance:Minimum working distance 58mm Field of view:8mm (WD=58mm), the higher the working distance, the larger the field of view. Suppression of strong light: 3 level regulation Edge enhancement: 3 level regulation Image output: VGA digital output Lighting: LED side light source Lifting focus range:Lifting range: 300mm, guide rail travel: 60mm Base size: 380*260*20mm
Product introduction: E-B130 video microscope, the perfect combination of HD megapixel CCD zoom lens and fine achievements, large field of view E-B130 video microscope, and work in a variety of distance can be imaged clearly, meet the needs of a variety of detection, the optical detection is more flexible; inhibit glare, edge enhancement and other functions, to adapt to the detection of the products of different materials; widely used in semiconductor, SMT, metal and plastic and other fields, to meet the detection of surface defects detection, process analysis.
