Introduction: Combined multi-functional X-ray diffractometers and high-resolution X-ray diffractometers are widely used in various fields of material structure analysis. The analyzed materials include: metal materials, inorganic materials, composite materials, organic materials, nano materials, and superconducting materials. The states of the materials that can be analyzed include: powder samples, bulk samples, thin film samples, and micro area micro samples. Widely used in clay minerals, cement building materials, environmental dust, chemical products, pharmaceuticals, asbestos, rock, minerals, polymers and other research areas. Features: 1.DX series diffractometer is designed for material research and industrial product analysis. It is a perfect product combined with routine analysis and special purpose measurement. Perfect combination of hardware system and software system to meet the needs of scholars and researchers in different application fields High-precision diffraction angle measurement system for more accurate measurement results High stability X-ray generator control system for more stable repeat measurement accuracy Various functional accessories to meet different test needs Programmatic operation, integrated structural design, easy operation, appearance of the instrument is more beautiful 2. X-ray diffractometer is a versatile test instrument for revealing the crystal structure and chemical information of materials: One or more phase identification in unknown samples Quantitative analysis of known phases in mixed samples Crystal structure analysis (Rietveld structure analysis) Crystal structure changes under unusual conditions (high temperature, low temperature conditions) Analysis of thin film samples including thin film phase, multilayer film thickness, surface roughness, charge density Micro-area sample analysis Metal texture, stress analysis 3. The combination of perfect quality and excellent performance In addition to the basic functions, the DX series diffractometers can quickly configure various accessories and provide superior analysis capabilities. High-precision mechanical processing greatly improves the reproducibility of the mounting position of the accessories. The software automatically recognizes the corresponding accessories and does not need to calibrate the light path. The attachment installation realizes plug-and-play, and the simplest operation can satisfy the special purpose measurement. need. 4. Perfect combination of high performance and practicality Based on θ-θ geometry optics design, easy sample preparation and installation of various accessories The application of cermet X-ray tube greatly improves the operating power of the diffractometer Closed proportional counter, durable and maintenance-free Silicon drift detector with superior angular resolution and energy resolution, measuring speeds up to 3 times higher Rich diffractometer accessories to meet different analytical needs Diffraction meter automatic identification of various function accessories Modular design or plug-and-play assembly allows the operator to correctly use the diffractometer's corresponding accessories without correcting the optical system
Introduction: Combined multi-functional X-ray diffractometers and high-resolution X-ray diffractometers are widely used in various fields of material structure analysis. The analyzed materials include: metal materials, inorganic materials, composite materials, organic materials, nano materials, and superconducting materials. The states of the materials that can be analyzed include: powder samples, bulk samples, thin film samples, and micro area micro samples. Widely used in clay minerals, cement building materials, environmental dust, chemical products, pharmaceuticals, asbestos, rock, minerals, polymers and other research areas.
