Bettersize 2600-1 intelligent laser particle size analyzer Introduction： Bettersize 2600 laser particle size analyzer is an intelligent laser particle size analyzer with positive and negative Fourier combined optical system. The most important feature of the positive and negative Fourier combined optical system is that it uses a single laser beam to achieve full-angle reception of forward, side and back scattered light signals-this is Baxter's original patented technology. This technology not only achieves the effect of using multi-beam technology to expand the scattered light angle of imported instruments, but also avoids the connection deviation of the intermittent scattered light signal caused by the multi-beam technology and the sample refractive index deviation caused by multiple wavelengths, making the test results more Accurate, and at the same time achieve accurate particle size testing of nanometer, micrometer and even millimeter-level samples. Due to the large number of detectors and the unique structure, the instrument has a strong ability to distinguish single-peak, double-peak and multi-peak samples. At the same time, the instrument also uses the sample refractive index measurement technology, automatic centering technology, anti-drying ultrasonic dispersion technology, SOP technology, high-power polarized light technology, etc., which further improves its repeatability, accuracy and resolution. Features： Forward and reverse Fourier combined optical path: Baxter's patented technology, combined with forward, side and backscatter technology, and tilted sample cell technology to achieve full-angle measurement. The measurement range is improved, the measurement accuracy at the fine particle end is improved, and the resolution is improved. Automatic circulation dispersion and automatic test technology: including anti-drying ultrasonic disperser, centrifugal circulation pump, automatic water inlet system, automatic drainage and overflow system, suitable for all samples, ensuring the full dispersion of samples and ensuring the accuracy and repeatability of the test Sex. Unique negative pressure detection technology to prevent lens pollution, advanced automatic alignment system to ensure that the system is always in the best condition. The advanced dry sample injection and dispersion system, the operations of sample injection, gas inlet, pressure test, concentration test and sample collection are all controlled by the computer, which is easy to operate and guarantees the stability of the test. Technical Parameters: Test range: 0.02-2600μm (wet method) 0.1-2600μm (dry method) Sampling method: wet automatic circulation dispersion system Dry automatic sampling system Wet method micro system (8ml) Repeatability error: ≤0.5% (D50 deviation of national standard sample) Accuracy error: ≤0.5% (D50 deviation of national standard sample) Bimodal resolution: ≥1.65 (the ratio of the nominal values of the two standards) Measuring principle: Mie scattering theory Measurement method: automatic measurement (SOP), automatic alignment Fastest measurement time: ≤10 seconds Laser light source: High-power polarized fiber laser (10mW/635nm) Optical path system: positive and negative Fourier combined optical path system Operating system: WinXP/Win7/Win8/Win10 Interface mode: USB2.0 or 3.0 Photodetectors: 92 Ultrasonic power: 50W Circulation pool volume: 600ml Circulation flow: 3000-8000 ml/min Dispersion medium: compressed air or inert gas Air compressor air pressure: 0.1-0.8MPa continuously adjustable Gas flow: 400-6000L/min dry test sample dosage 0.2g-10g Product mix: A × x% + B × (1-x%) = C Voltage: AC220V, 50/60Hz Host volume: 705×318×295mm Host weight: 23kg
Introduction： Bettersize 2600-1 laser particle size analyzer is an intelligent laser particle size analyzer with positive and negative Fourier combined optical system. The most important feature of the positive and negative Fourier combined optical system is that it uses a single laser beam to achieve full-angle reception of forward, side and back scattered light signals-this is Baxter's original patented technology. This technology not only achieves the effect of using multi-beam technology to expand the scattered light angle of imported instruments, but also avoids the connection deviation of the intermittent scattered light signal caused by the multi-beam technology and the sample refractive index deviation caused by multiple wavelengths, making the test results more Accurate, and at the same time achieve accurate particle size testing of nanometer, micrometer and even millimeter-level samples. Due to the large number of detectors and the unique structure, the instrument has a strong ability to distinguish single-peak, double-peak and multi-peak samples. At the same time, the instrument also uses the sample refractive index measurement technology, automatic centering technology, anti-drying ultrasonic dispersion technology, SOP technology, high-power polarized light technology, etc., which further improves its repeatability, accuracy and resolution.
