Introduction: X-ray diffractometer is a very common, widely used analytical instruments, mainly used in the sample phase qualitative or quantitative analysis, crystal structure analysis, material structure analysis, macro stress or micro-stress measurement, crystal size determination, Crystal size determination, crystallinity determination and so on, therefore, it has a wide range of applications in many disciplines and industries such as material science, physics, chemistry, chemical industry, metallurgy, minerals, medicine, building materials, ceramics ... Features: 1 unknown sample phase identification 2 Mixed phase known phase quantitative analysis 3 crystal structure analysis Designed for material research and industrial product analysis, the AL Series is the perfect product combining routine analysis with special purpose measurement. 4 perfect combination of hardware system and software system to meet the needs of scholars and researchers in different application fields 5 high-precision angle measurement system for more accurate measurement results 6 high stability generator control system, get more stable repeat measurement accuracy 7 program operation, integrated structural design, easy to operate, the appearance of the instrument more beautiful Technical Parameters: Model: AL-3000 Calibration power: 3kW Tube voltage: 10-60kV Tube current: 5-80mA X-ray tube: glass tube, ceramic tube, corrugated ceramic tube: Cu, Fe, Co, Cr, Mo, etc. Power 2kW Focus size: 1 × 10mm or 0.4 × 14mm or 2 × 12mm Stability: ≤ 0.01% Goniometer structure: horizontal (θ-2θ) Diffraction circle radius: 185mm Measuring range: 0-164 Scanning speed: 0.0012 ° -70 ° min Speed: 100 ° / min Scanning method: θ-2θ linkage, θ, 2θ single action; continuous or step scan Angle repeatability: 1/1000 ° Minimum step angle: 1/1000 ° Detector: proportional (PC) or flashing (SC) Linear count rate: 5 × 105CPS (with leakage count compensation function) Energy resolution: ≤ 25% (PC), ≤ 50% (SC) Counting method: differential or integral mode, automatic PHA, dead time correction System measurement stability: ≤ 0.01% Scattering dose: ≤ 1μSv / h (X-ray protective device outside) Instrument comprehensive stability: ≤ 0.5% Overall dimensions: 1100 × 850 × 1750mm
Introduction: X-ray diffractometer is a very common, widely used analytical instruments, mainly used in the sample phase qualitative or quantitative analysis, crystal structure analysis, material structure analysis, macro stress or micro-stress measurement, crystal size determination, Crystal size determination, crystallinity determination and so on, therefore, it has a wide range of applications in many disciplines and industries such as material science, physics, chemistry, chemical industry, metallurgy, minerals, medicine, building materials, ceramics ...
