LabXAFS Advance Atomic Electronic Structure Analyzer Introduction: Atomic electronic structure analyzer, which uses conventional X-ray sources to achieve spectral measurement of X-ray absorption fine structures (XAFS), has a good complementary and expanding role in major scientific and technological infrastructure such as synchrotron radiation, as well as scientific instruments such as electron microscopes and X-ray diffractometers. It is suitable for multiple sample morphologies and can achieve in-situ detection, characteristic: 1. Absorption spectrum fast scanning function 2. Real time display of absorption/emission spectra 3. Automatic switching of multiple sets of samples 4. Unmanned automatic testing 5. Wide spectrum X-ray detection system 6. Configure the X-ray emission spectrum module, with software control for automatic switching 7. Various in-situ experimental systems such as electrochemistry, high-temperature gas-solid, and secondary batteries 8. Customized bent crystals can be made according to user experimental needs 9. High resolution Roland ring structure X-ray monochromator with a wide energy range 10. Dual energy X-ray light source, software controlled automatic switching 11. Large aperture spherical curved crystal monochromator, achieving optimal resolution of various elements within the working energy range 12. Comprehensive in-situ functions, rich auxiliary sample preparation systems, and multiple combined functions 13. Pre calibrate the crystal bracket, replace the crystal plug and play, no need to re align and scan the signal 14. Technical support for testing methods and data analysis 15. Safety protection chain, with self shielding function, the surrounding environment dose meets radiation safety requirements, preventing personnel radiation injury caused by misoperation 16. Optional UV spectroscopy combined experimental system, magnetron sputtering sample preparation device, high current chemical workstation, liquid mass separation preparation system Technical parameters: Model: LabXAFS Advance Energy resolution: 0.5~1.5eV (@ 7~9keV) Energy range: 4.5~25keV High precision Roland circular energy spectrum scanning system, capable of covering Bragg angle range: 85 º~55 º Single scan range:>600eV (7-9 keV) Energy repeatability:<30meV
Introduction: Atomic electronic structure analyzer, which uses conventional X-ray sources to achieve spectral measurement of X-ray absorption fine structures (XAFS), has a good complementary and expanding role in major scientific and technological infrastructure such as synchrotron radiation, as well as scientific instruments such as electron microscopes and X-ray diffractometers. It is suitable for multiple sample morphologies and can achieve in-situ detection,
