Item | Details |
X-ray generator | Mo / Rh / W / Ag Target (Option), 50kV, 1mA |
Detector | SDD (Silicon Drift Detector) |
Resolution limit | 125eV (Mn Kα) |
X-ray coverage | 0.035mm(adjustable) |
Measuring range | Al (13) ~ U (92) |
Sample type | Solid / Liquid / Powder, Multi-Layer |
Size of sample chamber | 390 × 410 × 100 mm(W × D × H) |
Key features | - Auto / Manual Stage Mode - Plating thickness measurement general, Rh, Pd, Au, Ag, Sn, Ni - Film thickness measurement of multilayer thin films (up to 5Layer). |
Camera properties | 40 ~ 80 X |
safety | 3point interlock |
Type of report | Excel, PDF / output Custom form |