HR-Seed-fs mode-locked fiber picosecond/femtosecond laser seed source Introduction: The HR-Seed series of picosecond and femtosecond mode-locked fiber laser seed sources independently developed and manufactured by Huaray are characterized by ultra-high stability and reliability, and have independent intellectual property rights. It can be turned on with one button, maintenance-free, and guaranteed to work 24 hours a day, 7 days a week, suitable for OEM or R&D market. The product can be used as a seed source for picosecond or femtosecond laser amplifiers, as well as for micromachining, terahertz imaging, multiphoton spectroscopy, ultrafast spectroscopy, frequency combing, metrology, and more. Features: Spontaneous shock 2. Integrated design of light and electricity 3. One-button operation 4. Linear polarization output 5. Built-in optical isolation device 6. Built-in monitoring photocell 7. Remote control, maintenance free 8. No built-in amplifier, no ASE noise Technical Parameters: Model No. : HR-Seed-fs Center wavelength : 1030-1045 nm Spectral width: 10-20 nm Pulse width: < 10ps (Compressible <300fs) Average power : >8 mW Repeat frequency : 45±5 MHz Laser output: SM Fiber Coupling FC/APC (Optional: FC/UPC) Synchronous electrical signal output: SMA connector Polarization extinction ratio : > 20 dB Amplitude noise: <1% rms Working temperature : +10 to 40 °C Power supply : 12V DC Heat dissipation: < 10W Size : 200 × 130 × 50 mm3 Weight : <1.2 kg
Introduction: The HR-Seed series of picosecond and femtosecond mode-locked fiber laser seed sources independently developed and manufactured by Huaray are characterized by ultra-high stability and reliability, and have independent intellectual property rights. It can be turned on with one button, maintenance-free, and guaranteed to work 24 hours a day, 7 days a week, suitable for OEM or R&D market. The product can be used as a seed source for picosecond or femtosecond laser amplifiers, as well as for micromachining, terahertz imaging, multiphoton spectroscopy, ultrafast spectroscopy, frequency combing, metrology, and more.
