Wavelength range | 190—900nm |
wavelength accuracy | ±0.2nm |
baseline drift | <0.004A/30min |
Resolution | <0.2nm |
Characteristics of the concentration of Cu | <0.02μg/ml/1% |
Buckle background ability | >30 |
Detection LimitCu | <0.005μg/ml |
density measurement(RSD) | <0.8%(Cu) |
Wavelength Repeatability | <0.1nm |