E8-SPR coating thickness measuring instrument Introduction
The professional coating thickness measuring instrument HeLeeX E8-SPR is a high-performance energy dispersive X-ray fluorescence spectrometer (EDXRF), which has higher resolution than ordinary EDXRF, and its core optical path system gathers decades of EDXRF cutting-edge technology at home and abroad. The core components are imported from the United States, the software algorithm uses the US EDXRF cutting-edge technology, and the standard samples used by the instruments are reported by authoritative third-party testing organizations; E8-SPR uses small spot design, multiple working models to choose from, and the test data is more accurate and more stable. Features
1.The structure of the instrument is ergonomically designed. The two sides of the instrument are designed according to the length of the adult arm, which is convenient for moving and carrying.
2.The top cover is tilted by 6 degrees, which means respect for customers.
3.The surface is made of high-grade car painting process, with the combination of royal blue and elegant white, blue for technology, white for holiness, and moral respect for science.
4.Visualize the sample window.
5.Radiation protection:
6.The sample cover is inlaid with lead plates to shield X-rays.
7.Radiation sign warning.
8.Labyrinth structure to prevent radiation leakage.
9.Safety interlocking design; When the sample cover is accidentally opened during the test, the circuit is quickly cut off by 0.1μS. The X-ray dose rate is in full compliance with GB18871-2002 “Basic Standard for Ionizing Radiation Protection and Radiation Source Safety”. Technical parameter
Dimensions : 380 mm x 510mm x 365 mm (length x width x height)
Sample bin size: 360mm × 330 mm × 50 mm (length x width x height)
Instrument weight: 33.5kg
Power supply: AC220V/ 50Hz
Maximum power: 330W
Working temperature: 15-30 °C
Relative humidity: ≤85%, no condensation
Professional coating thickness measuring instrument HeLeeX E8-SPR is a high performance energy dispersive X-ray fluorescence spectrometer (EDXRF)
