Application: non-ferrous, ferrous metallurgy , mining sample analysis , all elements of testing cement . Features: 1.Samples automatic lifting platform , work is very easy ;
2.sample tray automatically rotate , measure larger, and can maximize the elimination of errors and uneven particles error ;
3.vacuum measurements, can a greater extent to improve the measurement element detection limits , is conducive to multi-metal measurement and other light elements measured ;
4.advanced modular design concept, to ensure follow-up of the instrument highly scalable ;
5.low- power X -ray tube terminal window larger diameter , the sample has better excitation efficiency ;
6.Superfast SDD more advanced electric refrigeration semiconductor detectors , resolution and count rate is higher, in favor require higher or more complex samples. Instrument Specifications Measuring range :1-40kev;
to analyze a range of elements : Na-U;
Analysis of content range : 1ppm-99.99%;
Resolution : ± 120Ev;
minimum detection limit : Pb ≤ 5ppm;
Operating temperature :0-40 °C;
Relative humidity : ≤ 80% ( non-condensing )
Measurement time :10-2550s ( time adjustable ) Input Power : AC 220V ± 10%, 50Hz;
Rated power : 300W;
Detector type : more advanced Superfast SDD detectors ;
5,000,000 pixel CCD camera, can effectively achieve the observed test area status , and photographed photo materials can be used as an integral part of the test report ;
Instrument Size : 600 (W) × 570 (D) × 570 (H) mm
sample chamber dimensions : Sample chamber : 300 * 300 * 100mm
Weight: about 100Kg
Application: non-ferrous, ferrous metallurgy , mining sample analysis , all elements of testing cement . Features: 1.Samples automatic lifting platform , work is very easy ;
2.sample tray automatically rotate , measure larger, and can maximize the elimination of errors and uneven particles error ;
3.vacuum measurements, can a greater extent to improve the measurement element detection limits , is conducive to multi-metal measurement and other light elements measured ;
4.advanced modular design concept, to ensure follow-up of the instrument highly scalable ;
5.low- power X -ray tube terminal window larger diameter , the sample has better excitation efficiency ;
6.Superfast SDD more advanced electric refrigeration semiconductor detectors , resolution and count rate is higher, in favor require higher or more complex samples.
